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1
Design considerations and effect of manufacturing process variations on UWB transceiver specifications 미리보기

회의자료

issue
2005 IEEE International Conference on Ultra-Wideband Ultra-wideband Ultra-Wideband, 2005. ICU 2005. 2005 IEEE International Conference on. :553-558 2005
Author
Senguttuvan, R.
Bhattacharya, S.
Chatterjee, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
2
Environment-Adaptive Concurrent Companding and Bias Control for Efficient Power-Amplifier Operation 미리보기

학술저널

issue
IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 58(3):607-618 Mar, 2011
Author
Sen, S.
Senguttuvan, R.
Chatterjee, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  조회 - Impact Factor (JCR)  등재 - Web of Science (SCIE)  등재 - SCOPUS 
3
Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers 미리보기

학술저널

issue
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 17(6):803-814 Jun, 2009
Author
Senguttuvan, R.
Bhattacharya, S.
Chatterjee, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  조회 - Impact Factor (JCR)  등재 - Web of Science (SCIE)  등재 - SCOPUS 
4
Multidimensional Adaptive Power Management for Low-Power Operation of Wireless Devices 미리보기

학술저널

issue
IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 55(9):867-871 Sep, 2008
Author
Senguttuvan, R.
Sen, S.
Chatterjee, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  조회 - Impact Factor (JCR)  등재 - Web of Science (SCIE)  등재 - SCOPUS  원문복사신청 - FRIC 
5
Test Method for Measuring Bit Error Rate of Pulsed Transceivers in Presence of Narrowband Interferers 미리보기

학술저널

issue
IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 55(9):1942-1950 Sep, 2007
Author
Senguttuvan, R.
Bhattacharya, S.
Chatterjee, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  조회 - Impact Factor (JCR)  등재 - Web of Science (SCIE)  등재 - SCOPUS  원문복사신청 - FRIC 
6
Production test technique for measuring BER of ultra-wideband (UWB) devices 미리보기

학술저널

issue
IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 53(11):3474-3481 Nov, 2005
Author
Bhattacharya, S.
Senguttuvan, R.
Chatterjee, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  조회 - Impact Factor (JCR)  등재 - Web of Science (SCIE)  등재 - SCOPUS  원문복사신청 - FRIC 
7
Iterative built-in testing and tuning of mixed-signal/RF systems 미리보기

회의자료

issue
2009 IEEE International Conference on Computer Design Computer Design, 2009. ICCD 2009. IEEE International Conference on. :319-326 Oct, 2009
Author
Chatterjee, A.
Han, D.
Natarajan, V.
Devarakond, S.
Sen, S.
Choi, H.
Senguttuvan, R.
Bhattacharya, S.
Goyal, A.
Lee, D.
Swaminathan, M.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
8
EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms 미리보기

회의자료

issue
2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-10 Oct, 2008
Author
Natarajan, V.
Choi, H.
Lee, D.
Senguttuvan, R.
Chatterjee, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
9
Production test method for evaluating the effect of narrow-band interference on data errors in ultra-wide band (UWB) receivers 미리보기

회의자료

issue
IEEE MTT-S International Microwave Symposium Digest, 2005. Microwave Symposium Microwave Symposium Digest, 2005 IEEE MTT-S International. :1513-1516 2005
Author
Bhattacharya, S.
Senguttuvan, R.
Chatterjee, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
10
Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF 미리보기

회의자료

issue
IEEE International Conference on Test, 2005. International Test Conference Test Conference, 2005. Proceedings. ITC 2005. IEEE International. :10 pp.-245 2005
Author
Bhattacharya, S.
Senguttuvan, R.
Chatterjee, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
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